In order to facilitate robust and high quality production, semiconductor manufacturers utilize test chips to evaluate and monitor their processes. These test chips contain a plurality of test keys that monitor the health of the process. These test keys can be tested by test equipment (parametric testers) through the connecting pads.
TCMagic® - Semitronix’s test chip design platform - provides a complete solution for the design of scribe-line, short-flow and MPW test chips. It offers layout automation, automatic place-and-routing, design documentation and testing program generation on one unified platform.
? Extensive built-in PCells, including all common PCM structures and yield related testing keys
? Supports exported PCells from SmtCell®
? DOE based testing key instantiation
? Template and table-based placement & routing to create testable modules
? Automatic design documentation generation
? Automatic testing program generation
? Comprehensive design error checks including built-in DRC, link to 3rd party DRC, structure level pin connection check, and routing connection check
MAJOR BENEFITS? Improves layout efficiency by at least 10X
Module GDSII Creation